Prof. Armando Albertazzi Gonçalves
Professor/Head of Metrology Lab at Univ Federal De Santa Catarina
Publications (75)

Proceedings Article | 22 August 2020 Poster + Paper
Proc. SPIE. 11503, Infrared Sensors, Devices, and Applications X
KEYWORDS: Calibration, Infrared cameras, Thermography, Nondestructive evaluation, Cameras, Infrared radiation, Inspection, Infrared imaging, Metrology

Proceedings Article | 21 August 2020 Presentation + Paper
Proc. SPIE. 11490, Interferometry XX
KEYWORDS: Shearography, Water, Composites, Fringe analysis, Nondestructive evaluation, Optical interferometry, Underwater imaging

Proceedings Article | 21 August 2020 Presentation + Paper
Proc. SPIE. 11510, Applications of Digital Image Processing XLIII
KEYWORDS: Image segmentation, Principal component analysis, Shearography, Image processing, Nondestructive evaluation, Composites

SPIE Journal Paper | 19 February 2020
OE Vol. 59 Issue 05
KEYWORDS: Image segmentation, Shearography, Nondestructive evaluation, Carbon, Wavelets, Convolutional neural networks, Image processing, Optical engineering, Image fusion, Defect detection

Proceedings Article | 21 June 2019 Paper
Proc. SPIE. 11056, Optical Measurement Systems for Industrial Inspection XI
KEYWORDS: Principal component analysis, Image segmentation, Thermography, Nondestructive evaluation, Image processing, Statistical analysis

Showing 5 of 75 publications
Proceedings Volume Editor (7)

SPIE Conference Volume | 22 August 2019

SPIE Conference Volume | 18 July 2017

SPIE Conference Volume | 1 September 2016

SPIE Conference Volume | 18 May 2015

SPIE Conference Volume | 9 April 2013

Showing 5 of 7 publications
Conference Committee Involvement (24)
Optical Measurement Systems for Industrial Inspection XII
21 June 2021 | Munich, Germany
Interferometry XX
24 August 2020 | Online Only, California, United States
Optical Measurement Systems for Industrial Inspection XI
24 June 2019 | Munich, Germany
Interferometry XIX
21 August 2018 | San Diego, California, United States
Optical Measurement Systems for Industrial Inspection X
26 June 2017 | Munich, Germany
Showing 5 of 24 Conference Committees
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