Prof. Armando Albertazzi Gonçalves
Professor/Head of Metrology Lab at Univ Federal de Santa Catarina
Publications (73)

PROCEEDINGS ARTICLE | September 7, 2018
Proc. SPIE. 10751, Optics and Photonics for Information Processing XII
KEYWORDS: Optical design, Light sources, Light emitting diodes, Cameras, Image processing, Criminalistics, Forensic science

PROCEEDINGS ARTICLE | September 7, 2018
Proc. SPIE. 10834, Speckle 2018: VII International Conference on Speckle Metrology
KEYWORDS: Fringe analysis, Speckle, Fourier transforms, Speckle pattern, Phase measurement, Shearography, Phase shifts

PROCEEDINGS ARTICLE | May 24, 2018
Proc. SPIE. 10678, Optical Micro- and Nanometrology VII
KEYWORDS: Optical components, Diffraction, General applications engineering, Speckle, Interferometers, Speckle pattern, Speckle interferometry, Shearography

PROCEEDINGS ARTICLE | August 24, 2017
Proc. SPIE. 10376, Novel Optical Systems Design and Optimization XX
KEYWORDS: Diffractive optical elements, Interferometers, Composites, Inspection, Optical inspection, Shearography, Defect inspection

SPIE Conference Volume | July 18, 2017

PROCEEDINGS ARTICLE | June 26, 2017
Proc. SPIE. 10329, Optical Measurement Systems for Industrial Inspection X
KEYWORDS: Endoscopy, Mirrors, Interferometers, Composites, Inspection, Analytical research, Shearography

Showing 5 of 73 publications
Conference Committee Involvement (22)
Optical Measurement Systems for Industrial Inspection XI
24 June 2019 | Munich, Germany
Interferometry XIX
21 August 2018 | San Diego, California, United States
Optical Measurement Systems for Industrial Inspection X
26 June 2017 | Munich, Germany
Interferometry XVIII
30 August 2016 | San Diego, California, United States
Optical Measurement Systems for Industrial Inspection IX
22 June 2015 | Munich, Germany
Showing 5 of 22 published special sections
SIGN IN TO:
  • View contact details

UPDATE YOUR PROFILE
Is this your profile? Update it now.
Don’t have a profile and want one?

Back to Top