Dr. Armin W. Knoll
at IBM Research Zurich
SPIE Involvement:
Author
Publications (8)

Proceedings Article | 13 June 2022 Presentation
Proceedings Volume PC12054, PC120540S (2022) https://doi.org/10.1117/12.2624509

Proceedings Article | 1 August 2021 Presentation + Paper
Proceedings Volume 11798, 117980M (2021) https://doi.org/10.1117/12.2593705
KEYWORDS: Nanoparticles, Light scattering, Diffusion, Interferometry

Proceedings Article | 21 March 2016 Paper
Christian Neuber, Hans-Werner Schmidt, Peter Strohriegl, Daniel Wagner, Felix Krohn, Andreas Schedl, Simon Bonanni, Felix Holzner, Colin Rawlings, Urs Dürig, Armin Knoll
Proceedings Volume 9779, 97791C (2016) https://doi.org/10.1117/12.2219080
KEYWORDS: Scanning probe lithography, Molecules, Physical vapor deposition, Polymers, Photoresist materials, Lithography, Resistance, Etching, Crystals, Silicon, Silica, Optical lithography, Thin films

Proceedings Article | 20 March 2015 Paper
Christian Neuber, Hans-Werner Schmidt, Peter Strohriegl, Andreas Ringk, Tristan Kolb, Andreas Schedl, Vincent Fokkema, Marijn G. van Veghel, Mike Cooke, Colin Rawlings, Urs Dürig, Armin Knoll, Jean- François de Marneffe, Ziad el Otell, Marcus Kaestner, Yana Krivoshapkina, Matthias Budden, Ivo Rangelow
Proceedings Volume 9425, 94250E (2015) https://doi.org/10.1117/12.2085734
KEYWORDS: Glasses, Scanning probe lithography, Etching, Thin films, Optical lithography, Plasma etching, Resistance, Electron beam lithography, Lithography, Crystals

Proceedings Article | 28 March 2014 Paper
Christian Neuber, Andreas Ringk, Tristan Kolb, Florian Wieberger, Peter Strohriegl, Hans-Werner Schmidt, Vincent Fokkema, Mike Cooke, Colin Rawlings, Urs Dürig, Armin Knoll, Jean-Francois de Marneffe, Peter De Schepper, Marcus Kaestner, Yana Krivoshapkina, Matthias Budden, Ivo Rangelow
Proceedings Volume 9049, 90491V (2014) https://doi.org/10.1117/12.2047108
KEYWORDS: Glasses, Etching, Scanning probe lithography, Lithography, Optical lithography, Silicon, Electron beam lithography, Polymers, Resistance, Photoresist processing

Showing 5 of 8 publications
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