Dr. Arnaud Tournier
at STMicroelectronics
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 12 March 2008
Proc. SPIE. 6817, Digital Photography IV
KEYWORDS: Oxides, Signal to noise ratio, CMOS sensors, Interfaces, Interference (communication), Doping, Dielectrophoresis, Capacitance, Transistors, Signal detection

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