Dr. Arndt Last
at Karlsruher Institut für Technologie
SPIE Involvement:
Publications (22)

SPIE Journal Paper | 14 February 2024 Open Access
Michael Richter, Thomas Beckenbach, Constantin Rauch, Stephan Schreiner, Marcus Zuber, Elias Hamann, Arndt Last, Martin Börner, Jan Korvink, Pascal Meyer
JM3, Vol. 23, Issue 01, 014901, (February 2024) https://doi.org/10.1117/12.10.1117/1.JMM.23.1.014901
KEYWORDS: Bridges, X-rays, Gold, Scanning electron microscopy, Metals, Electroplating, Nickel, Photoresist processing, Fabrication, Optical gratings

SPIE Journal Paper | 25 May 2022 Open Access
Michael Richter, Thomas Beckenbach, Heiner Daerr, Sven Prevrhal, Martin Börner, Josephine Gutekunst, Pouria Zangi, Arndt Last, Jan Korvink, Pascal Meyer
JM3, Vol. 21, Issue 02, 024901, (May 2022) https://doi.org/10.1117/12.10.1117/1.JMM.21.2.024901
KEYWORDS: X-rays, Interfaces, Semiconducting wafers, X-ray lithography, X-ray imaging, X-ray detectors, Metals, Manufacturing, X-ray sources, Silicon

Proceedings Article | 27 September 2013 Paper
Werner Jark, Arndt Last, Ottó Márkus
Proceedings Volume 8848, 884806 (2013) https://doi.org/10.1117/12.2023921
KEYWORDS: Prisms, Monochromators, X-rays, Dispersion, Spectral resolution, Refraction, Refractive index, Interfaces, X-ray optics, High speed photonics

Proceedings Article | 3 May 2013 Paper
Proceedings Volume 8777, 877712 (2013) https://doi.org/10.1117/12.2017446
KEYWORDS: Prisms, Monochromators, X-rays, Spectral resolution, Refraction, Switching, Dispersion, Refractive index, Chromatic aberrations, X-ray optics

Proceedings Article | 21 September 2011 Paper
H. Vogt, M. Simon, A. Last, F. Marschall, J. Mohr, V. Nazmov, R. Eisenhower, K. Mettendorf
Proceedings Volume 8167, 81670V (2011) https://doi.org/10.1117/12.897004
KEYWORDS: Lenses, X-rays, Prisms, X-ray optics, Sensors, X-ray diffraction, X-ray microscopy, Collimators, Glasses, Neodymium

Showing 5 of 22 publications
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