Arno Duijster
at Univ Antwerp
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 2 October 2007
Proc. SPIE. 6763, Wavelet Applications in Industrial Processing V
KEYWORDS: Signal to noise ratio, Wavelet transforms, Principal component analysis, Wavelets, Denoising, Image restoration, Fourier transforms, Deconvolution, Global system for mobile communications, Expectation maximization algorithms

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