Artem Yaroshchuk
at Steinbeis Qualitätssicherung und Bildverarbeitung GmbH
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 17 September 2019
Proc. SPIE. 11144, Photonics and Education in Measurement Science 2019
KEYWORDS: Modeling, 3D applications, Imaging systems, Cameras, Calibration, Image processing, Distortion, Clouds, 3D modeling, 3D image processing

SIGN IN TO:
  • View contact details

UPDATE YOUR PROFILE
Is this your profile? Update it now.
Don’t have a profile and want one?

Advertisement
Advertisement
Back to Top