Dr. Artur G. Olszak
VP Engineering at Äpre Instruments Inc
SPIE Involvement:
Area of Expertise:
Optical Metrology
Publications (20)

Proceedings Article | 15 November 2019 Presentation + Paper
Proc. SPIE. 11175, Optifab 2019
KEYWORDS: Mirrors, Light sources, Astronomy, Phase shifting, Interferometry, Turbulence, Distance measurement, Phase measurement, Tolerancing, Environmental sensing

Proceedings Article | 28 June 2019 Paper
Proc. SPIE. 11171, Sixth European Seminar on Precision Optics Manufacturing
KEYWORDS: Optical components, Phase shifting, Ferroelectric materials, Modulation, Interferometry, Phase shift keying, Optical testing, Spherical lenses, Phase shifts, Fizeau interferometers

Proceedings Article | 18 August 2018 Presentation + Paper
Proc. SPIE. 10749, Interferometry XIX
KEYWORDS: Phase shifting, Metrology, Modulation, Interferometers, Interferometry, Phase measurement, Phase shifts, Fizeau interferometers

Proceedings Article | 7 August 2018 Paper
Proc. SPIE. 10829, Fifth European Seminar on Precision Optics Manufacturing
KEYWORDS: Monochromatic aberrations, Refractive index, Modulation, Interferometers, Interferometry, Wavefronts, Adaptive optics, Optical testing, Fizeau interferometers

Proceedings Article | 16 October 2017 Paper
Proc. SPIE. 10448, Optifab 2017
KEYWORDS: Phase shifting, Modulation, Reflection, Interferometers, Interferometry, Optical testing, Optical metrology, Laser interferometry, Spherical lenses, Visibility

Showing 5 of 20 publications
Conference Committee Involvement (2)
Interferometry XX
24 August 2020 | Online Only, California, United States
Interferometry XIX
21 August 2018 | San Diego, California, United States
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