Dr. Artur G. Olszak
VP Engineering at Äpre Instruments, LLC
SPIE Involvement:
Conference Program Committee | Author
Area of Expertise:
Optical Metrology
Websites:
Publications (19)

Proceedings Article | 28 June 2019
Proc. SPIE. 11171, Sixth European Seminar on Precision Optics Manufacturing
KEYWORDS: Optical components, Phase shifting, Ferroelectric materials, Modulation, Interferometry, Phase shift keying, Optical testing, Spherical lenses, Phase shifts, Fizeau interferometers

Proceedings Article | 18 August 2018
Proc. SPIE. 10749, Interferometry XIX
KEYWORDS: Phase shifting, Metrology, Modulation, Interferometers, Interferometry, Phase measurement, Phase shifts, Fizeau interferometers

Proceedings Article | 7 August 2018
Proc. SPIE. 10829, Fifth European Seminar on Precision Optics Manufacturing
KEYWORDS: Monochromatic aberrations, Refractive index, Modulation, Interferometers, Interferometry, Wavefronts, Adaptive optics, Optical testing, Fizeau interferometers

Proceedings Article | 16 October 2017
Proc. SPIE. 10448, Optifab 2017
KEYWORDS: Phase shifting, Modulation, Reflection, Interferometers, Interferometry, Optical testing, Optical metrology, Laser interferometry, Spherical lenses, Visibility

Proceedings Article | 7 March 2006
Proc. SPIE. 4101, Laser Interferometry X: Techniques and Analysis
KEYWORDS: Light sources, Coherence (optics), Modulation, Interferometers, Cameras, Calibration, Interferometry, Head, Profilometers, Charge-coupled devices

Showing 5 of 19 publications
Conference Committee Involvement (2)
Interferometry XX
23 August 2020 | San Diego, California, United States
Interferometry XIX
21 August 2018 | San Diego, California, United States
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