Dr. Arunachalam Narayanaperumal
Assistant Professor at Indian Institute of Technology Madras
SPIE Involvement:
Author
Publications (1)

PROCEEDINGS ARTICLE | March 17, 2017
Proc. SPIE. 10341, Ninth International Conference on Machine Vision (ICMV 2016)
KEYWORDS: Image processing, Inspection, Image acquisition, Feature extraction, Image analysis, Machine vision, Image filtering, Image enhancement, Image classification, Binary data

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