Prof. Assad A. Oberai
at Univ of Southern California
SPIE Involvement:
Author
Publications (8)

SPIE Journal Paper | 20 April 2020
JM3 Vol. 19 Issue 02
KEYWORDS: Data modeling, Convolution, Semiconductors, Defect detection, Performance modeling, Semiconducting wafers, Image classification, Inspection, Content addressable memory, Process modeling

Proceedings Article | 26 March 2019
Proc. SPIE. 10959, Metrology, Inspection, and Process Control for Microlithography XXXIII
KEYWORDS: Semiconductors, Defect detection, Convolutional neural networks, Inspection, Neural networks, Image classification, Convolution, Semiconducting wafers

Proceedings Article | 4 March 2019
Proc. SPIE. 10880, Optical Elastography and Tissue Biomechanics VI
KEYWORDS: Coherence (optics), Tissues, Optical coherence tomography, Inverse problems, In vivo imaging, Phase measurement, Elastography

Proceedings Article | 4 March 2019
Proc. SPIE. 10867, Optical Coherence Tomography and Coherence Domain Optical Methods in Biomedicine XXIII
KEYWORDS: Image compression, Coherence (optics), Visualization, Optical coherence tomography, Stem cells, Tissue optics, Elastography, Natural surfaces, 3D image processing

Proceedings Article | 24 April 2017
Proc. SPIE. 10067, Optical Elastography and Tissue Biomechanics IV
KEYWORDS: Optical imaging, Coherence imaging, Coherence (optics), Visualization, Inverse problems, Data processing, Tissue optics, Elastography, Inverse optics, 3D image processing

Showing 5 of 8 publications
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