Prof. Astrid Haibel
at Beuth Hochschule für Technik Berlin
SPIE Involvement:
Author
Publications (5)

PROCEEDINGS ARTICLE | September 20, 2010
Proc. SPIE. 7804, Developments in X-Ray Tomography VII
KEYWORDS: Optical components, X-ray optics, Lenses, Sensors, Photons, Crystals, X-rays, Tomography, Spatial resolution, Monochromators

PROCEEDINGS ARTICLE | September 20, 2010
Proc. SPIE. 7804, Developments in X-Ray Tomography VII
KEYWORDS: Optical design, Magnesium, Interferometers, X-rays, Radiography, Tomography, Aluminum, Synchrotron radiation, X-ray imaging, Synchrotron x-ray imaging

PROCEEDINGS ARTICLE | September 18, 2008
Proc. SPIE. 7078, Developments in X-Ray Tomography VI
KEYWORDS: Diffraction, Nondestructive evaluation, Laser beam propagation, Tomography, Aluminum, Computed tomography, Spatial resolution, Synchrotron radiation, Tolerancing, Testing and analysis

PROCEEDINGS ARTICLE | September 17, 2008
Proc. SPIE. 7078, Developments in X-Ray Tomography VI
KEYWORDS: Sensors, Signal attenuation, Crystals, X-rays, Materials science, Tomography, Spatial resolution, Synchrotron radiation, Monochromators, Crystallography

PROCEEDINGS ARTICLE | September 16, 2008
Proc. SPIE. 7078, Developments in X-Ray Tomography VI
KEYWORDS: Diffraction, X-ray optics, Lenses, Photons, X-rays, Materials science, Tomography, Spatial resolution, Monochromators, Hard x-rays

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