Prof. Astrid Haibel
at Beuth Hochschule für Technik Berlin
SPIE Involvement:
Author
Publications (5)

Proceedings Article | 20 September 2010
Proc. SPIE. 7804, Developments in X-Ray Tomography VII
KEYWORDS: Tomography, X-ray optics, X-rays, Sensors, Spatial resolution, Monochromators, Lenses, Optical components, Photons, Crystals

Proceedings Article | 20 September 2010
Proc. SPIE. 7804, Developments in X-Ray Tomography VII
KEYWORDS: Interferometers, X-rays, Tomography, X-ray imaging, Aluminum, Synchrotron radiation, Synchrotron x-ray imaging, Magnesium, Radiography, Optical design

Proceedings Article | 18 September 2008
Proc. SPIE. 7078, Developments in X-Ray Tomography VI
KEYWORDS: Synchrotron radiation, Aluminum, Tomography, Computed tomography, Nondestructive evaluation, Spatial resolution, Diffraction, Laser beam propagation, Tolerancing, Testing and analysis

Proceedings Article | 17 September 2008
Proc. SPIE. 7078, Developments in X-Ray Tomography VI
KEYWORDS: Spatial resolution, Synchrotron radiation, X-rays, Tomography, Sensors, Signal attenuation, Monochromators, Materials science, Crystals, Crystallography

Proceedings Article | 16 September 2008
Proc. SPIE. 7078, Developments in X-Ray Tomography VI
KEYWORDS: Tomography, X-rays, Diffraction, Monochromators, Materials science, Spatial resolution, Photons, X-ray optics, Lenses, Hard x-rays

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