Dr. Athanasios J. Syllaios
Retired
SPIE Involvement:
Author
Publications (13)

Proceedings Article | 14 May 2018
Proc. SPIE. 10656, Image Sensing Technologies: Materials, Devices, Systems, and Applications V
KEYWORDS: Particles, Amorphous silicon, Temperature metrology, Metals, Microbolometers, Resistance, Nanoparticles, Data modeling, Vanadium, Dielectrics

Proceedings Article | 31 May 2012
Proc. SPIE. 8353, Infrared Technology and Applications XXXVIII
KEYWORDS: Silicon, Oxygen, Germanium, Silicon films, Thin films, Temperature metrology, Microbolometers, Resistance, Oxides, X-ray diffraction

Proceedings Article | 21 May 2011
Proc. SPIE. 8012, Infrared Technology and Applications XXXVII
KEYWORDS: Amorphous silicon, Hydrogen, Staring arrays, Microbolometers, Sensors, Readout integrated circuits, Capacitors, Resistance, Bolometers, Packaging

Proceedings Article | 28 July 2010
Proc. SPIE. 7660, Infrared Technology and Applications XXXVI
KEYWORDS: Staring arrays, Amorphous silicon, Capacitors, Digital filtering, Packaging, Sensors, Semiconducting wafers, Readout integrated circuits, Electronic filtering, Infrared radiation

Proceedings Article | 4 May 2010
Proc. SPIE. 7660, Infrared Technology and Applications XXXVI
KEYWORDS: Amorphous silicon, Microbolometers, Hydrogen, Thin films, Temperature metrology, Plasma, Infrared sensors, Sensors, Resistance, Infrared radiation

Showing 5 of 13 publications
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