Dr. Athanasios P. Zeris
at
SPIE Involvement:
Author
Publications (1)

PROCEEDINGS ARTICLE | June 13, 2005
Proc. SPIE. 5856, Optical Measurement Systems for Industrial Inspection IV
KEYWORDS: Statistical analysis, Doppler effect, Sensors, Calibration, Physics, Signal processing, Laser Doppler velocimetry, Turbulence, 3D metrology, Velocity measurements

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