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Dr. Atsushi Nishikawa
at ALLOS Semiconductors GmbH
SPIE Involvement:
Author
Publications (1)
Proceedings Article | 1 March 2019 Paper
Achieving high uniformity and yield for micro LED applications with precise strain-engineered large-diameter epiwafers
A. Nishikawa, A. Loesing, B. Slischka
Proceedings Volume 10940, 109400Z (2019) https://doi.org/10.1117/12.2511390
KEYWORDS: Light emitting diodes, Semiconducting wafers, LED displays, Silicon, Manufacturing, Gallium nitride, Temperature metrology, Control systems, LCDs, Organic light emitting diodes
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