Dr. Audrey Leong-Hoï
at Altran Technologies
SPIE Involvement:
Author
Publications (8)

PROCEEDINGS ARTICLE | March 14, 2018
Proc. SPIE. 10500, Single Molecule Spectroscopy and Superresolution Imaging XI
KEYWORDS: Optical microscopes, Real time imaging, Super resolution, Microscopy, Dielectrics, Image acquisition, Image resolution, Spatial resolution, Near field optics, Photonic nanostructures

PROCEEDINGS ARTICLE | June 26, 2017
Proc. SPIE. 10329, Optical Measurement Systems for Industrial Inspection X
KEYWORDS: Diffraction, Metrology, Interferometers, Glasses, Microscopy, Inspection, Image resolution, Interferometry, Near field optics, Photonic nanostructures

PROCEEDINGS ARTICLE | June 26, 2017
Proc. SPIE. 10330, Modeling Aspects in Optical Metrology VI
KEYWORDS: Modeling, Optical microscopes, Diffraction, Coherence imaging, Refractive index, Light sources, Super resolution, Microscopy, Optical microscopy, Image resolution, Near field, Super resolution microscopy, Spectral resolution, Optical resolution, Geometrical optics

PROCEEDINGS ARTICLE | April 26, 2016
Proc. SPIE. 9890, Optical Micro- and Nanometrology VI
KEYWORDS: Signal to noise ratio, Image resolution, Signal processing, Image enhancement

PROCEEDINGS ARTICLE | April 26, 2016
Proc. SPIE. 9890, Optical Micro- and Nanometrology VI
KEYWORDS: Optical imaging, Confocal microscopy, Nanostructures, Super resolution, Digital holography, Nanoparticles, Microscopy, Molecules, Optical microscopy, Image resolution, Tomography, Super resolution microscopy, Deconvolution, Time division multiplexing

PROCEEDINGS ARTICLE | June 21, 2015
Proc. SPIE. 9528, Videometrics, Range Imaging, and Applications XIII
KEYWORDS: Signal to noise ratio, Cameras, Polymers, Image processing, Denoising, Particles, Interferometry, CCD cameras, Tomography, Signal processing

Showing 5 of 8 publications
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