Dr. Aurélien Tavernier
at CEA
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 10 April 2024 Presentation
Proceedings Volume PC12958, (2024) https://doi.org/10.1117/12.3010137
KEYWORDS: Plasma etching, Microlens, Optoelectronic devices, Plasma, Etching, Passivation, Deformation, X-ray photoelectron spectroscopy, Vacuum chambers, Surface roughness

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