Mr. Avinash Burla
at Univ Stuttgart
SPIE Involvement:
Author
Publications (10)

SPIE Journal Paper | June 5, 2012
OE Vol. 51 Issue 6
KEYWORDS: Genetics, Computer programming, Inspection, Detection and tracking algorithms, Binary data, Evolutionary algorithms, Sensors, Defect detection, Algorithm development, Optical engineering

PROCEEDINGS ARTICLE | April 28, 2012
Proc. SPIE. 8430, Optical Micro- and Nanometrology IV
KEYWORDS: Microscopes, Fringe analysis, Data modeling, Sensors, Calibration, Inspection, Clouds, Data acquisition, Zoom lenses, Sensor calibration

PROCEEDINGS ARTICLE | May 23, 2011
Proc. SPIE. 8082, Optical Measurement Systems for Industrial Inspection VII
KEYWORDS: Microscopes, Genetic algorithms, Defect detection, Detection and tracking algorithms, Sensors, Image processing, Inspection, Optical inspection, Genetics, Binary data

SPIE Journal Paper | April 1, 2011
OE Vol. 50 Issue 04
KEYWORDS: Lenses, Microlens array, Sensors, Confocal microscopy, Microscopes, Defect detection, Inspection, Microlens, Optical engineering, Monochromatic aberrations

PROCEEDINGS ARTICLE | September 8, 2010
Proc. SPIE. 7798, Applications of Digital Image Processing XXXIII
KEYWORDS: Microelectromechanical systems, Actuators, Image processing algorithms and systems, Edge detection, Sensors, Calibration, Image segmentation, Image processing, Inspection, Optical resolution

PROCEEDINGS ARTICLE | August 31, 2010
Proc. SPIE. 7783, Optics Education and Outreach
KEYWORDS: Polarization, Birefringence, Photography, Polarizers, Distortion, Projection systems, Outreach programs, Negative feedback, RGB color model, Current controlled current source

Showing 5 of 10 publications
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