Dr. Axel Berthold Profile

Dr. Axel Berthold

at Fraunhofer-IZFP

SPIE Involvement:

Conference Program Committee | Author

Publications (8)

PROCEEDINGS ARTICLE | April 10, 2007

X-ray detectors for NDE applications

Proc. SPIE. 6530, Sensor Systems and Networks: Phenomena, Technology, and Applications for NDE and Health Monitoring 2007

KEYWORDS: Sensors, Photons, X-rays, Gallium arsenide, Silicon, Semiconducting wafers, X-ray detectors, PIN photodiodes, Americium, Absorption

Read Abstract

PROCEEDINGS ARTICLE | March 30, 2006

New trends in NDE and health monitoring

Proc. SPIE. 6179, Advanced Sensor Technologies for Nondestructive Evaluation and Structural Health Monitoring II

KEYWORDS: Electronics, Sensors, Inspection, Nondestructive evaluation, Ultrasonics, Sensor networks, Transducers, Signal processing, Phased arrays, Acoustics

Read Abstract

PROCEEDINGS ARTICLE | May 9, 2005

Sensor modules for structural health monitoring and reliability of components

Proc. SPIE. 5770, Advanced Sensor Technologies for Nondestructive Evaluation and Structural Health Monitoring

KEYWORDS: Digital signal processing, Safety, Sensors, Reliability, Inspection, Nondestructive evaluation, Signal processing, Structural health monitoring, Wind energy, Data communications

Read Abstract

PROCEEDINGS ARTICLE | May 9, 2005

Materials investigation of gallium arsenide for direct converting energy sensitive x-ray detectors

Proc. SPIE. 5770, Advanced Sensor Technologies for Nondestructive Evaluation and Structural Health Monitoring

KEYWORDS: Sensors, Photons, X-rays, Gallium arsenide, Silicon, Semiconducting wafers, X-ray detectors, PIN photodiodes, Americium, Absorption

Read Abstract

PROCEEDINGS ARTICLE | August 18, 2000

Backwafer optical lithography and wafer distortion in substrate transfer technologies

Proc. SPIE. 4181, Challenges in Process Integration and Device Technology

KEYWORDS: Lithography, Mirrors, Optical lithography, Silicon, Optical alignment, Semiconducting wafers, Overlay metrology

Read Abstract

PROCEEDINGS ARTICLE | July 20, 1998

Micromachined wet cell for a Love-wave liquid sensor

Proc. SPIE. 3328, Smart Structures and Materials 1998: Smart Electronics and MEMS

KEYWORDS: Sensors, Etching, Silicon, Wave propagation, Transducers, Photomasks, Aluminum, Acoustics, Semiconducting wafers, Liquids

Read Abstract

PROCEEDINGS ARTICLE | July 20, 1998

Low-temperature quartz-to-silicon bonding for SAW applications

Proc. SPIE. 3328, Smart Structures and Materials 1998: Smart Electronics and MEMS

KEYWORDS: Thin films, Sensors, Etching, Quartz, Metals, Silicon, Silicon films, Acoustics, Semiconducting wafers, Thin film devices

Read Abstract

PROCEEDINGS ARTICLE | September 5, 1997

Influence of processes and selective bonding technology

Proc. SPIE. 3223, Micromachining and Microfabrication Process Technology III

KEYWORDS: Oxides, Silicon, Surface roughness, Chemical vapor deposition, Low pressure chemical vapor deposition, Plasma enhanced chemical vapor deposition, Temperature metrology

Read Abstract

Showing 5 of 8 publications

Conference Committee Involvement (3)

Smart Sensor Phenomena, Technology, Networks, and Systems

10 March 2008 | San Diego, California, United States

Sensor Systems and Networks: Phenomena, Technology and Applications for NDE and Health Monitoring

19 March 2007 | San Diego, California, United States

Advanced Sensor Technologies for NDE and Structural Health Monitoring II

1 March 2006 | San Diego, CA, United States

View contact details

UPDATE YOUR PROFILE

Is this your profile? Update it now.

Sign into your SPIE.org account

Don’t have a profile and want one?

Create an account on SPIE.org

Keywords/Phrases

Search In:

Publication Years