Dr. Axel Schindler
at Univ Stuttgart
SPIE Involvement:
Publications (15)

Proceedings Article | 13 September 2005 Paper
Russell Kurtz, Ranjit Pradhan, Alexander Parfenov, Jason Holmstedt, Vladimir Esterkin, Naresh Menon, Tin Aye, Kang-Bin Chua, Axel Schindler, Alexander Balandin, James Nichter
Proceedings Volume 5925, 59250T (2005) https://doi.org/10.1117/12.617888
KEYWORDS: Photodetectors, Quantum dots, Silicon, Sensors, Telecommunications, Germanium, Capacitance, Semiconducting wafers, Amplifiers, Superlattices

Proceedings Article | 25 May 2005 Paper
Russell Kurtz, Ranjit Pradhan, Tin Aye, Kevin Yu, Albert Okorogu, Kang-Bin Chua, Nay Tun, Tin Win, Axel Schindler
Proceedings Volume 5801, (2005) https://doi.org/10.1117/12.604052
KEYWORDS: 3D displays, 3D image processing, Eye, Glasses, Holography, Autostereoscopic displays, Volume holography, 3D vision, Holographic optical elements, 3D volumetric displays

Proceedings Article | 19 May 2005 Paper
Proceedings Volume 5800, (2005) https://doi.org/10.1117/12.604157
KEYWORDS: Head-mounted displays, Image resolution, Spatial light modulators, Prototyping, Eye, Modulation transfer functions, LCDs, Projection systems, Analog electronics, Liquid crystal on silicon

Proceedings Article | 28 March 2005 Paper
Russell Kurtz, Alexander Parfenov, Ranjit Pradhan, Tin Aye, Gajendra Savant, Nay Tun, Tin Win, Jason Holmstedt, Axel Schindler
Proceedings Volume 5813, (2005) https://doi.org/10.1117/12.604142
KEYWORDS: Sensors, Projection systems, Long wavelength infrared, Mid-IR, Visible radiation, Imaging systems, Infrared imaging, Reflectivity, Infrared radiation, Modulation transfer functions

Proceedings Article | 22 December 2003 Paper
Thomas Haensel, Axel Schindler, Brian Dissing
Proceedings Volume 5180, (2003) https://doi.org/10.1117/12.508286
KEYWORDS: Etching, Ion beams, Diffraction gratings, Silicon, Holography, Surface finishing, Atomic force microscopy, Ions, Polishing, Photomasks

Showing 5 of 15 publications
Conference Committee Involvement (2)
Optical Manufacturing and Testing VI
31 July 2005 | San Diego, California, United States
Optical Manufacturing and Testing V
3 August 2003 | San Diego, California, United States
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