Dr. Axel Schindler Profile

Dr. Axel Schindler

at Univ Stuttgart

SPIE Involvement:

Author

Publications (15)

Proceedings Article | 13 September 2005 Paper

Paper

High speed nanotechnology-based photodetector

Russell Kurtz, Ranjit Pradhan, Alexander Parfenov, Jason Holmstedt, Vladimir Esterkin, Naresh Menon, Tin Aye, Kang-Bin Chua, Axel Schindler, Alexander Balandin, James Nichter

Proceedings Volume 5925, 59250T (2005) https://doi.org/10.1117/12.617888

KEYWORDS: Photodetectors, Quantum dots, Silicon, Sensors, Telecommunications, Germanium, Capacitance, Semiconducting wafers, Amplifiers, Superlattices

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Proceedings Article | 25 May 2005 Paper

Paper

Development of an automultiscopic true 3D display

Russell Kurtz, Ranjit Pradhan, Tin Aye, Kevin Yu, Albert Okorogu, Kang-Bin Chua, Nay Tun, Tin Win, Axel Schindler

Proceedings Volume 5801, (2005) https://doi.org/10.1117/12.604052

KEYWORDS: 3D displays, 3D image processing, Eye, Glasses, Holography, Autostereoscopic displays, Volume holography, 3D vision, Holographic optical elements, 3D volumetric displays

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Proceedings Article | 19 May 2005 Paper

Paper

Image tiling for a high-resolution helmet-mounted display

Russell Kurtz, Ranjit Pradhan, Tin Aye, Kang-Bin Chua, Indra Tengara, Nay Tun, Tin Win, Jason Holmstedt, Axel Schindler, Steffen Hergert

Proceedings Volume 5800, (2005) https://doi.org/10.1117/12.604157

KEYWORDS: Head-mounted displays, Image resolution, Spatial light modulators, Prototyping, Eye, Modulation transfer functions, LCDs, Projection systems, Analog electronics, Liquid crystal on silicon

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Proceedings Article | 28 March 2005 Paper

Paper

A new approach to wideband scene projection

Russell Kurtz, Alexander Parfenov, Ranjit Pradhan, Tin Aye, Gajendra Savant, Nay Tun, Tin Win, Jason Holmstedt, Axel Schindler

Proceedings Volume 5813, (2005) https://doi.org/10.1117/12.604142

KEYWORDS: Sensors, Projection systems, Long wavelength infrared, Mid-IR, Visible radiation, Imaging systems, Infrared imaging, Reflectivity, Infrared radiation, Modulation transfer functions

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Proceedings Article | 22 December 2003 Paper

Paper

Multiple high-period-accuracy gratings fabricated by holographic exposure and ion-beam etching with nanometer depth accuracy in silicon

Thomas Haensel, Axel Schindler, Brian Dissing

Proceedings Volume 5180, (2003) https://doi.org/10.1117/12.508286

KEYWORDS: Etching, Ion beams, Diffraction gratings, Silicon, Holography, Surface finishing, Atomic force microscopy, Ions, Polishing, Photomasks

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Proceedings Article | 22 December 2003 Paper

Paper

Ion beam milling of optically polished CaF2 surfaces

Dieter Flamm, Axel Schindler, Marion Berger

Proceedings Volume 5180, (2003) https://doi.org/10.1117/12.505658

KEYWORDS: Ions, Surface finishing, Calcium, Polishing, Ion beams, Sputter deposition, Gases, Vacuum ultraviolet, Crystals, Oxides

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Proceedings Article | 22 December 2003 Paper

Paper

Finishing procedure for high-performance synchrotron optics

Axel Schindler, Thomas Haensel, Andreas Nickel, Hans-Juergen Thomas, Heiner Lammert, Frank Siewert

Proceedings Volume 5180, (2003) https://doi.org/10.1117/12.506505

KEYWORDS: Ion beams, Surface finishing, Ion beam finishing, Nano opto mechanical systems, Polishing, Silicon, Magnetorheological finishing, Etching, Mirrors, Photovoltaics

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Proceedings Article | 27 December 2001 Paper

Paper

Precision optical asphere fabrication by plasma jet chemical etching (PJCE) and ion beam figuring

Axel Schindler, Georg Boehm, Thomas Haensel, Wilfried Frank, Andreas Nickel, Bernd Rauschenbach, Frieder Bigl

Proceedings Volume 4451, (2001) https://doi.org/10.1117/12.453622

KEYWORDS: Plasma, Aspheric lenses, Quartz, Plasma etching, Microwave radiation, Wet etching, Temperature metrology, Etching, Surface finishing, Silica

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Proceedings Article | 10 December 2001 Paper

Paper

Stitching interferometry of aspherical surfaces

Thomas Haensel, Andreas Nickel, Axel Schindler

Proceedings Volume 4449, (2001) https://doi.org/10.1117/12.450103

KEYWORDS: Aspheric lenses, Stitching interferometry, Surface finishing, Interferometers, Optics manufacturing, Polishing, Error analysis, Ion beams, Interferometry, Optical testing

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Proceedings Article | 10 December 2001 Paper

Paper

AFM tip calibration using nanometer-sized structures induced by ion beam sputtering

Frank Frost, Dietmar Hirsch, Axel Schindler, Bernd Rauschenbach

Proceedings Volume 4449, (2001) https://doi.org/10.1117/12.450098

KEYWORDS: Ions, Silicon, Atomic force microscopy, Sputter deposition, Surface roughness, Calibration, Gallium antimonide, Ion beams, Thin films, Argon

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Proceedings Article | 9 November 2001 Paper

Paper

Ion beam and plasma jet etching for optical component fabrication

Axel Schindler, Thomas Haensel, Dieter Flamm, Wilfried Frank, Georg Boehm, Frank Frost, Renate Fechner, Frieder Bigl, Bernd Rauschenbach

Proceedings Volume 4440, (2001) https://doi.org/10.1117/12.448043

KEYWORDS: Ion beams, Etching, Ions, Surface finishing, Plasma, Plasma etching, Polishing, Silica, Ion beam finishing, Argon

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Proceedings Article | 20 August 2001 Paper

Paper

Flatness correction of NZTE mask blank substrates

Lutz Aschke, Fredi Schubert, Joerg Kegeler, Axel Schindler, Thomas Haensel, Konrad Knapp

Proceedings Volume 4343, (2001) https://doi.org/10.1117/12.436634

KEYWORDS: Ion beams, Etching, Ion beam finishing, Polishing, Zerodur, Surface finishing, Photomasks, Spatial frequencies, Extreme ultraviolet lithography, Ions

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Proceedings Article | 18 August 2000 Paper

Paper

Fabrication of microlens arrays in CaF2 by ion milling

Dieter Flamm, Axel Schindler, Torsten Harzendorf, Ernst-Bernhard Kley

Proceedings Volume 4179, (2000) https://doi.org/10.1117/12.395680

KEYWORDS: Ions, Etching, Photoresist materials, Calcium, Microlens, Surface roughness, Sputter deposition, Lenses, Ion beams, Microlens array

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Proceedings Article | 6 September 1999 Paper

Paper

Ion beam figuring of SiC mirrors provides ultimate WFE performances for any type of telescope

Michel Fruit, Axel Schindler, Thomas Haensel

Proceedings Volume 3739, (1999) https://doi.org/10.1117/12.360138

KEYWORDS: Mirrors, Silicon carbide, Ion beams, Space telescopes, Telescopes, Etching, Polishing, Space mirrors, Ion beam finishing, Off axis mirrors

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Proceedings Article | 6 September 1999 Paper

Paper

Reactive ion beam etching: a fabrication process for the figuring of precision aspheric optical surfaces in fused silica

Dieter Flamm, Thomas Haensel, Axel Schindler, Andreas Nickel, H.-J. Thomas

Proceedings Volume 3739, (1999) https://doi.org/10.1117/12.360142

KEYWORDS: Ion beams, Etching, Ions, Silica, Aspheric lenses, Surface roughness, Reactive ion etching, Carbon, Camera shutters, Plasma

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Showing 5 of 15 publications

Conference Committee Involvement (2)

Optical Manufacturing and Testing VI

31 July 2005 | San Diego, California, United States

Optical Manufacturing and Testing V

3 August 2003 | San Diego, California, United States

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