Dr. Axel Schindler
at scia Systems GmbH
SPIE Involvement:
Publications (5)

Proceedings Article | 27 August 2015 Paper
O. Faehnle, E. Langenbach, F. Zygalsky, F. Frost, R. Fechner, A. Schindler, M. Cumme, H. Biskup, C. Wünsche, R. Rascher
Proceedings Volume 9575, 957512 (2015) https://doi.org/10.1117/12.2189790
KEYWORDS: Surface roughness, Calibration, Silicon, Etching, Atomic force microscopy, Silica, Ion beams, Reactive ion etching, Measurement devices, Polishing

Proceedings Article | 25 April 2006 Paper
Manuel Flury, Nikolay Lyndin, Renate Fechner, Axel Schindler, Svetlen Tonchev, Michel Spajer, Youcef Ouerdane, Nathalie Destouches, David Pietroy, Stéphanie Reynaud, Olivier Parriaux
Proceedings Volume 6187, 61871I (2006) https://doi.org/10.1117/12.668374
KEYWORDS: Diffraction, Diffraction gratings, Femtosecond phenomena, Silica, Mirrors, Hybrid fiber optics, Reflection, Multilayers, Sensors, Sapphire lasers

Proceedings Article | 20 October 2005 Paper
Volker Herold, Heiner Lammert, Axel Schindler, Rainer Schwennicke, Frank Siewert
Proceedings Volume 5965, 596521 (2005) https://doi.org/10.1117/12.625552
KEYWORDS: Tungsten, Mirrors, Silicon carbide, Silicon, Chemical mechanical planarization, Synchrotron radiation, Prototyping, Crystals, Surface finishing, Zerodur

Proceedings Article | 17 September 2005 Paper
Frank Siewert, Heiner Lammert, Tino Noll, Thomas Schlegel, Thomas Zeschke, Thomas Hänsel, Andreas Nickel, Axel Schindler, Bernd Grubert, Carsten Schlewitt
Proceedings Volume 5921, 592101 (2005) https://doi.org/10.1117/12.622747
KEYWORDS: Nano opto mechanical systems, Optical components, Surface finishing, Mirrors, Metrology, Ion beams, Optics manufacturing, Ion beam finishing, Ocean optics, Spatial resolution

Proceedings Article | 9 May 2005 Paper
Evgeny Twerdowski, Reinhold Wannemacher, Axel Schindler, Nasser Razek, Wolfgang Grill
Proceedings Volume 5768, (2005) https://doi.org/10.1117/12.599758
KEYWORDS: Semiconducting wafers, Acoustics, Interfaces, Wafer bonding, Microscopy, Point spread functions, Ultrasonics, Transducers, Silicon, Nondestructive evaluation

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