Dr. Ayman M. Samara
PhD Student at Intel Corp
SPIE Involvement:
Author
Publications (2)

PROCEEDINGS ARTICLE | August 18, 2005
Proc. SPIE. 5879, Recent Developments in Traceable Dimensional Measurements III
KEYWORDS: Monochromatic aberrations, Mirrors, Light sources, Moire patterns, Calibration, Interferometry, Projection systems, Ronchi rulings, Phase measurement, Phase shifts

PROCEEDINGS ARTICLE | August 18, 2005
Proc. SPIE. 5879, Recent Developments in Traceable Dimensional Measurements III
KEYWORDS: Microscopes, Phase shifting, Interferometers, Cameras, Surface roughness, Wavefronts, Projection systems, Charge-coupled devices, Phase measurement, Surface finishing

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