Dr. Ayman M. Samara
PhD Student at Intel Corp
SPIE Involvement:
Author
Publications (2)

PROCEEDINGS ARTICLE | August 18, 2005
Proc. SPIE. 5879, Recent Developments in Traceable Dimensional Measurements III
KEYWORDS: Calibration, Projection systems, Mirrors, Phase measurement, Monochromatic aberrations, Ronchi rulings, Moire patterns, Interferometry, Phase shifts, Light sources

PROCEEDINGS ARTICLE | August 18, 2005
Proc. SPIE. 5879, Recent Developments in Traceable Dimensional Measurements III
KEYWORDS: Surface finishing, Interferometers, Phase shifting, Cameras, Projection systems, Charge-coupled devices, Wavefronts, Surface roughness, Phase measurement, Microscopes

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