PROCEEDINGS ARTICLE | March 14, 2016
Proc. SPIE. 9752, Silicon Photonics XI
KEYWORDS: Oxides, Thin films, Visible radiation, Silica, Visualization, Graphene, Silicon, Reflectivity, Transition metals, Optoelectronics, Semiconducting wafers, Visibility, Absorption
In order to protect optoelectronic and mechanical properties of atomically thin layered materials (ATLMs) fabricated over SiO<sub>2</sub>/Si substrates, a secondary oxide or nitride layer can be capped over. However, such protective capping might decrease ATLMs’ visibility dramatically. Similar to the early studies conducted for graphene, we numerically determine optimum thicknesses both for capping and underlying oxide layers for strongest visibility of monolayer MoS<sub>2</sub>, MoSe<sub>2</sub>, WS<sub>2</sub>, and WSe<sub>2</sub> in different regions of visible spectrum. We find that the capping layer should not be thicker than 60 nm. Furthermore the optimum capping layer thickness value can be calculated as a function of underlying oxide thickness, and vice versa.
