Prof. Xuefei Bai
at Hebei Univ of Technology
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 14 November 2016
Proc. SPIE. 10025, Advanced Sensor Systems and Applications VII
KEYWORDS: Fringe analysis, Biometrics, 3D acquisition, Databases, Feature extraction, Gaussian filters, 3D metrology, Image filtering, Digital Light Processing, 3D image processing

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