Bangzhou Ding
Dr. at Hefei Univ of Technology
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 24 March 2009
Proc. SPIE. 7272, Metrology, Inspection, and Process Control for Microlithography XXIII
KEYWORDS: Fiber Bragg gratings, Sensors, Interferometers, Fiber optics sensors, Data acquisition, Optoelectronics, Data processing, Signal to noise ratio, Mirrors, Refractive index

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