Baokai Feng
at Dalian University of Technology
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 7 March 2019
Proc. SPIE. 11053, Tenth International Symposium on Precision Engineering Measurements and Instrumentation
KEYWORDS: Diffraction, Refractive index, Mirrors, Interferometers, Sensors, Calibration, Semiconductor lasers, Autocollimators, Michelson interferometers, Diffraction gratings

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