Dr. Bart P. Nys
at NICC
SPIE Involvement:
Author
Publications (2)

PROCEEDINGS ARTICLE | June 3, 2010
Proc. SPIE. 7729, Scanning Microscopy 2010
KEYWORDS: Defense and security, Weapons, Contamination, Statistical analysis, Data modeling, Particles, Forensic science, Legal, Firearms, Lawrencium

PROCEEDINGS ARTICLE | May 22, 2009
Proc. SPIE. 7378, Scanning Microscopy 2009
KEYWORDS: Microscopes, Contamination, Statistical analysis, Particles, Forensic science, Scanning electron microscopy, Legal, Analytical research, Document management, Printed circuit board testing

SIGN IN TO:
  • View contact details

UPDATE YOUR PROFILE
Is this your profile? Update it now.
Don’t have a profile and want one?

Back to Top