Bartosz Banachowicz
Engineer at Cypress Semiconductor Corp
SPIE Involvement:
Author
Publications (4)

PROCEEDINGS ARTICLE | February 12, 2010
Proc. SPIE. 7617, Light-Emitting Diodes: Materials, Devices, and Applications for Solid State Lighting XIV
KEYWORDS: Optical filters, Light emitting diodes, Optical sensors, Sensors, Solid state lighting, Metals, Photodiodes, Prototyping, Temperature metrology, RGB color model

PROCEEDINGS ARTICLE | September 23, 2009
Proc. SPIE. 7474, Sensors, Systems, and Next-Generation Satellites XIII
KEYWORDS: Semiconductors, Unmanned aerial vehicles, CMOS sensors, Imaging systems, Cameras, Sensors, Quantum efficiency, Image resolution, Modulation transfer functions, Camera shutters

PROCEEDINGS ARTICLE | May 3, 2004
Proc. SPIE. 5379, Design and Process Integration for Microelectronic Manufacturing II
KEYWORDS: Oxides, Etching, Metals, Diffusion, Printing, Photomasks, Optical proximity correction, Optical alignment, Tolerancing, Phase shifts

PROCEEDINGS ARTICLE | May 28, 2003
Proc. SPIE. 5148, 19th European Conference on Mask Technology for Integrated Circuits and Microcomponents
KEYWORDS: Cadmium, Data modeling, Calibration, Databases, Error analysis, Silicon, Optical proximity correction, Computer aided design, Model-based design, Solid modeling

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