Bashirul A. Polash
at Univ of Texas-Pan American
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 28 February 2008
Proc. SPIE. 6894, Gallium Nitride Materials and Devices III
KEYWORDS: Field effect transistors, Temperature metrology, Gallium nitride, Transistors, Numerical simulations, Capacitance, Semiconducting wafers, Computer simulations, Instrument modeling, Electronics

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