Dr. Behrang H. Hamadani
at National Institute of Standards and Technology
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 13 September 2007 Paper
Proceedings Volume 6658, 66580V (2007) https://doi.org/10.1117/12.734433
KEYWORDS: Field effect transistors, Instrument modeling, Transistors, Polymers, Resistance, Data modeling, Semiconductors, Gold, Electrodes, Information operations

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