Prof. Beiwen Li
Assistant Professor at Iowa State Univ
SPIE Involvement:
Conference Program Committee | Author
Publications (11)

PROCEEDINGS ARTICLE | May 14, 2018
Proc. SPIE. 10667, Dimensional Optical Metrology and Inspection for Practical Applications VII
KEYWORDS: Fringe analysis, 3D acquisition, 3D metrology, Strain analysis

PROCEEDINGS ARTICLE | February 22, 2018
Proc. SPIE. 10546, Emerging Digital Micromirror Device Based Systems and Applications X
KEYWORDS: Fringe analysis, Phase shifting, Fourier transforms, Phase retrieval, 3D metrology, Motion measurement

SPIE Journal Paper | January 29, 2018
OE Vol. 57 Issue 01
KEYWORDS: Calibration, Cameras, Projection systems, Phase shifts, Binary data, 3D metrology, 3D modeling, Lithium, 3D image processing, Fringe analysis

SPIE Journal Paper | July 6, 2017
OE Vol. 56 Issue 07
KEYWORDS: Binary data, Digital Light Processing, Projection systems, Optical testing, Projection devices, Fringe analysis

PROCEEDINGS ARTICLE | February 20, 2017
Proc. SPIE. 10117, Emerging Digital Micromirror Device Based Systems and Applications IX
KEYWORDS: Signal to noise ratio, Fringe analysis, Metrology, Three dimensional sensing, Imaging systems, Calibration, Stereoscopy, 3D metrology, Micromirrors, Phase measurement, Binary data, Digital Light Processing, Phase shifts

PROCEEDINGS ARTICLE | August 28, 2016
Proc. SPIE. 9960, Interferometry XVIII
KEYWORDS: Fringe analysis, Cameras, Error analysis, Fourier transforms, 3D metrology, Projection systems, Motion measurement, Binary data, Phase shifts, Francium

Showing 5 of 11 publications
Conference Committee Involvement (3)
Emerging Digital Micromirror Device Based Systems and Applications XI
2 February 2019 | San Francisco, California, United States
Interferometry XIX
22 August 2018 | San Diego, California, United States
Dimensional Optical Metrology and Inspection for Practical Applications VII
18 April 2018 | Orlando, Florida, United States
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