Prof. Beiwen Li
Assistant Professor at Iowa State University at Iowa State University
SPIE Involvement:
Conference Program Committee | Author
Publications (8)

SPIE Journal Paper | July 6, 2017
OE Vol. 56 Issue 07
KEYWORDS: Binary data, Digital Light Processing, Projection systems, Optical testing, Projection devices, Fringe analysis

PROCEEDINGS ARTICLE | February 20, 2017
Proc. SPIE. 10117, Emerging Digital Micromirror Device Based Systems and Applications IX
KEYWORDS: Signal to noise ratio, Fringe analysis, Metrology, Three dimensional sensing, Imaging systems, Calibration, Stereoscopy, 3D metrology, Micromirrors, Phase measurement, Binary data, Digital Light Processing, Phase shifts

PROCEEDINGS ARTICLE | August 28, 2016
Proc. SPIE. 9960, Interferometry XVIII
KEYWORDS: Fringe analysis, Cameras, Error analysis, Fourier transforms, 3D metrology, Projection systems, Motion measurement, Binary data, Phase shifts, Francium

PROCEEDINGS ARTICLE | November 13, 2014
Proc. SPIE. 9276, Optical Metrology and Inspection for Industrial Applications III
KEYWORDS: Fringe analysis, Cameras, LCDs, 3D metrology, Projection systems, 3D displays, Binary data, Digital Light Processing, Polonium, Phase shifts

PROCEEDINGS ARTICLE | August 18, 2014
Proc. SPIE. 9203, Interferometry XVII: Techniques and Analysis
KEYWORDS: Optical fibers, Fringe analysis, Modulation, Wavefronts, Phase shift keying, Modulators, 3D metrology, Electro optics, Algorithm development, Phase shifts

PROCEEDINGS ARTICLE | May 28, 2014
Proc. SPIE. 9110, Dimensional Optical Metrology and Inspection for Practical Applications III
KEYWORDS: Signal to noise ratio, Fringe analysis, Cameras, Quality measurement, Liquid crystal on silicon, 3D metrology, Projection systems, Binary data, Digital Light Processing, Phase shifts

Showing 5 of 8 publications
Conference Committee Involvement (2)
Interferometry XIX
19 August 2018 | San Diego, California, United States
Dimensional Optical Metrology and Inspection for Practical Applications VII
18 April 2018 | Orlando, Florida, United States
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