Prof. Beiwen Li Profile

Prof. Beiwen Li

Associate Professor at Iowa State University

SPIE Involvement:

Conference Program Committee | Conference Co-Chair | Editor | Author

Publications (26)

Proceedings Article | 30 May 2022 Presentation

AI-powered 3D shape measurement through a phase-to-phase network

Beiwen Li, Vignesh Suresh

Proceedings Volume PC12098, PC1209804 (2022) https://doi.org/10.1117/12.2622761

KEYWORDS: 3D metrology, Phase measurement, Phase shifting, 3D image reconstruction, 3D image processing, Neural networks, Medicine, Machine learning, Fourier transforms

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Proceedings Article | 30 May 2022 Presentation

Single-camera line-scan hyperspectral 4D imaging based on fringe projection

Jiaqiong Li, Yi Zheng, Beiwen Li

Proceedings Volume PC12098, PC1209803 (2022) https://doi.org/10.1117/12.2622527

KEYWORDS: Line scan image sensors, Hyperspectral imaging, Computing systems, Video, Stereoscopy, Spectrographs, Spatial resolution, Projection systems, Optical sensing, Nondestructive evaluation

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Proceedings Article | 12 April 2021 Presentation + Paper

High-resolution structured light 3D vision for fine-scale characterization to assist robotic assembly

Vignesh Suresh, Wansong Liu, Minghui Zheng, Beiwen Li

Proceedings Volume 11732, 1173203 (2021) https://doi.org/10.1117/12.2589755

KEYWORDS: Robotics, 3D vision, Structured light, Stereoscopy, Visualization, Sensors, Image sensors, Robots, Robotic systems, Reconstruction algorithms

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Proceedings Article | 5 March 2021 Presentation + Paper

Digital twin-trained deep convolutional neural networks for fringe analysis

Yi Zheng, Beiwen Li

Proceedings Volume 11698, 116980K (2021) https://doi.org/10.1117/12.2582823

KEYWORDS: Fringe analysis, Convolutional neural networks, Systems modeling, Data modeling, 3D modeling, Imaging systems, Phase shifting, Optical scanning systems, Medicine, Manufacturing

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Proceedings Article | 10 October 2020 Presentation + Paper

Improved three-dimensional reconstruction model based on coaxial structured light system

Jing Zhang, Bin Luo, Xin Su, Lu Li, Beiwen Li, Song Zhang, Yajun Wang

Proceedings Volume 11552, 1155210 (2020) https://doi.org/10.1117/12.2575190

KEYWORDS: 3D modeling, Structured light, Projection systems, Calibration, Imaging systems, Cameras, Mathematical modeling, Distortion

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Proceedings Article | 21 August 2020 Paper

Photomechanics evaluation combining fringe projection and digital height correlation

Vignesh Suresh, Yuxi Chi, Bing Pan, Beiwen Li

Proceedings Volume 11490, 114900J (2020) https://doi.org/10.1117/12.2570931

KEYWORDS: Digital image correlation, 3D metrology, Fringe analysis

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Proceedings Article | 21 April 2020 Presentation + Paper

Vignesh Suresh, Yi Zheng, Xiao Zhang, Shaodong Wang, Hantang Qin, Qing Li, Beiwen Li

Proceedings Volume 11397, 113970A (2020) https://doi.org/10.1117/12.2557627

KEYWORDS: 3D metrology, 3D image processing, Statistical methods, Structured light, Inspection, Manufacturing, Microscopy

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Proceedings Article | 21 April 2020 Presentation + Paper

Uniaxial fringe projection profilometry using projection defocus

Yi Zheng, Yajun Wang, Beiwen Li

Proceedings Volume 11397, 1139708 (2020) https://doi.org/10.1117/12.2558996

KEYWORDS: Fringe analysis, Calibration, 3D metrology, Point spread functions

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Proceedings Article | 28 February 2020 Presentation + Paper

Digital image correlation for highly reflective objects using digital micro-mirror device

Vignesh Suresh, Beiwen Li

Proceedings Volume 11294, 112940P (2020) https://doi.org/10.1117/12.2544510

KEYWORDS: Digital image correlation, High dynamic range imaging, Digital micromirror devices, Digital Light Processing

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Proceedings Article | 13 May 2019 Presentation + Paper

Real-time high dynamic range 3D scanning with RGB camera

Yi Zheng, Yajun Wang, Beiwen Li

Proceedings Volume 10991, 109910I (2019) https://doi.org/10.1117/12.2518372

KEYWORDS: High dynamic range imaging, 3D metrology, 3D image processing, Image fusion, 3D acquisition

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Proceedings Article | 13 May 2019 Presentation + Paper

High dynamic range 3D shape measurement based on multispectral imaging

Yajun Wang, Yi Zheng, Vignesh Suresh, Beiwen Li

Proceedings Volume 10991, 109910M (2019) https://doi.org/10.1117/12.2518784

KEYWORDS: High dynamic range imaging, 3D metrology, Modulation, Cameras, Optical filters, Binary data, Phase shifts, Phase shift keying, Projection systems, 3D image processing

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Proceedings Article | 13 May 2019 Presentation + Paper

Motion-induced error reduction for phase shifting profilometry using double-shot-in-single-illumination technique

Vignesh Suresh, Yajun Wang, Beiwen Li

Proceedings Volume 10991, 1099108 (2019) https://doi.org/10.1117/12.2518319

KEYWORDS: Phase shifting, 3D metrology, Fringe analysis

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Proceedings Article | 4 March 2019 Presentation + Paper

High-speed high dynamic range 3D shape measurement with digital micro-mirror device

Vignesh Suresh, Beiwen Li

Proceedings Volume 10932, 109320G (2019) https://doi.org/10.1117/12.2505150

KEYWORDS: 3D image reconstruction, High dynamic range imaging, 3D metrology, Cameras, 3D image processing, Image quality, 3D acquisition, Fringe analysis

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Proceedings Article | 4 March 2019 Presentation + Paper

Motion induced error compensation method for digital fringe projection system

Yajun Wang, Beiwen Li, Song Zhang

Proceedings Volume 10932, 109320F (2019) https://doi.org/10.1117/12.2511395

KEYWORDS: Phase shifts, Fringe analysis, 3D metrology, Error analysis, Projection systems, Motion estimation, Motion measurement, Calibration, Motion models

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Proceedings Article | 18 August 2018 Presentation + Paper

High-resolution 3D shape deformation, displacement, and strain measurement for robotic flapping wings

Beiwen Li

Proceedings Volume 10749, 107490E (2018) https://doi.org/10.1117/12.2321656

KEYWORDS: 3D metrology, Digital image correlation, Robotics, 3D acquisition, Mechanics, 3D image processing, Photogrammetry, Structured light

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Proceedings Article | 14 May 2018 Presentation + Paper

Superfast, high-resolution dynamic 3D strain measurement of robotic flapping wings

Beiwen Li

Proceedings Volume 10667, 106670G (2018) https://doi.org/10.1117/12.2302811

KEYWORDS: 3D metrology, 3D acquisition, Fringe analysis, Strain analysis

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Proceedings Article | 22 February 2018 Presentation + Paper

Superfast 3D shape measurement of a flapping flight process with motion based segmentation

Beiwen Li

Proceedings Volume 10546, 105460A (2018) https://doi.org/10.1117/12.2287989

KEYWORDS: Phase shifting, 3D metrology, Fourier transforms, Fringe analysis, Phase retrieval, Motion measurement

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SPIE Journal Paper | 29 January 2018

Calibration method for spinning fringe projection: proof-of-concept

Jace Holton, Beiwen Li

OE, Vol. 57, Issue 01, 014110, (January 2018) https://doi.org/10.1117/12.10.1117/1.OE.57.1.014110

KEYWORDS: Calibration, Cameras, Projection systems, Phase shifts, Binary data, 3D metrology, 3D modeling, Lithium, 3D image processing, Fringe analysis

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SPIE Journal Paper | 6 July 2017

High-speed high-accuracy three-dimensional shape measurement using digital binary defocusing method versus sinusoidal method

Jae-Sang Hyun, Beiwen Li, Song Zhang

OE, Vol. 56, Issue 07, 074102, (July 2017) https://doi.org/10.1117/12.10.1117/1.OE.56.7.074102

KEYWORDS: Binary data, Digital Light Processing, Projection systems, Optical testing, Projection devices, Fringe analysis

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Proceedings Article | 20 February 2017 Paper

High-speed 3D imaging using digital binary defocusing method vs sinusoidal method

Song Zhang, Jae-Sang Hyun, Beiwen Li

Proceedings Volume 10117, 1011707 (2017) https://doi.org/10.1117/12.2250698

KEYWORDS: Binary data, Digital Light Processing, Signal to noise ratio, 3D metrology, Micromirrors, Three dimensional sensing, Imaging systems, Metrology, Fringe analysis, Phase shifts, Phase measurement, Stereoscopy, Calibration

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Proceedings Article | 28 August 2016 Presentation + Paper

Motion artifact reduction using hybrid Fourier transform with phase-shifting methods

Beiwen Li, Ziping Liu, Song Zhang

Proceedings Volume 9960, 99600K (2016) https://doi.org/10.1117/12.2236244

KEYWORDS: Fourier transforms, Phase shifts, Fringe analysis, Motion measurement, Cameras, 3D metrology, Error analysis, Projection systems, Francium, Binary data

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Proceedings Article | 13 November 2014 Paper

Comparing digital-light-processing (DLP) and liquid-crystal-display(LCD) projection technologies for high-quality 3D shape measurement

Chen Gong, Beiwen Li, Song Zhang

Proceedings Volume 9276, 92760Q (2014) https://doi.org/10.1117/12.2071536

KEYWORDS: Projection systems, Digital Light Processing, LCDs, 3D metrology, Cameras, Polonium, 3D displays, Binary data, Fringe analysis, Phase shifts

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Proceedings Article | 18 August 2014 Paper

High-speed 3D shape measurement with fiber interference

Beiwen Li, Pan Ou, Song Zhang

Proceedings Volume 9203, 920310 (2014) https://doi.org/10.1117/12.2060562

KEYWORDS: Phase shifts, 3D metrology, Fringe analysis, Modulators, Wavefronts, Optical fibers, Algorithm development, Modulation, Electro optics, Phase shift keying

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Proceedings Article | 28 May 2014 Paper

Comparing digital-light-processing (DLP) and liquid-crystal-on-silicon (LCoS) technologies for high-quality 3D shape measurement

Chen Gong, Beiwen Li, Kevin Harding, Song Zhang

Proceedings Volume 9110, 911004 (2014) https://doi.org/10.1117/12.2050786

KEYWORDS: Digital Light Processing, Projection systems, Liquid crystal on silicon, 3D metrology, Cameras, Binary data, Signal to noise ratio, Quality measurement, Fringe analysis, Phase shifts

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Proceedings Article | 6 September 2013 Paper

Improve dithering technique for 3D shape measurement: phase vs intensity optimization

Junfei Dai, Beiwen Li, Song Zhang

Proceedings Volume 8839, 883904 (2013) https://doi.org/10.1117/12.2022226

KEYWORDS: 3D metrology, Binary data, Fringe analysis, Projection systems, Gaussian filters, Phase shifts, Phase measurement, Quality measurement, Phase shift keying, Modulation

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Proceedings Article | 6 September 2013 Paper

Comparison between LCOS projector and DLP projector in generating digital sinusoidal fringe patterns

Beiwen Li, John Gibson, Jill Middendorf, Yajun Wang, Song Zhang

Proceedings Volume 8839, 883908 (2013) https://doi.org/10.1117/12.2022225

KEYWORDS: Projection systems, Digital Light Processing, Liquid crystal on silicon, Fringe analysis, Cameras, 3D metrology, Mirrors, Polonium, Liquid crystals, Micromirrors

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Showing 5 of 26 publications

Proceedings Volume Editor (3)

SPIE Conference Volume | 18 July 2023

Dimensional Optical Metrology and Inspection for Practical Applications XII

SPIE Conference Volume | 16 June 2022

Dimensional Optical Metrology and Inspection for Practical Applications XI

SPIE Conference Volume | 3 May 2021

Dimensional Optical Metrology and Inspection for Practical Applications X

Conference Committee Involvement (17)

Emerging Digital Micromirror Device Based Systems and Applications XVII

25 January 2025 | San Francisco, California, United States

Interferometry and Structured Light 2024

21 August 2024 | San Diego, California, United States

Dimensional Optical Metrology and Inspection for Practical Applications XIII

24 April 2024 | National Harbor, Maryland, United States

Emerging Digital Micromirror Device Based Systems and Applications XVI

30 January 2024 | San Francisco, California, United States

Dimensional Optical Metrology and Inspection for Practical Applications XII

2 May 2023 | Orlando, Florida, United States

Emerging Digital Micromirror Device Based Systems and Applications XV

30 January 2023 | San Francisco, California, United States

Interferometry XXI

24 August 2022 | San Diego, California, United States

Dimensional Optical Metrology and Inspection for Practical Applications XI

5 April 2022 | Orlando, Florida, United States

Emerging Digital Micromirror Device Based Systems and Applications XIV

25 January 2022 | San Francisco, California, United States

Dimensional Optical Metrology and Inspection for Practical Applications X

12 April 2021 | Online Only, Florida, United States

Emerging Digital Micromirror Device Based Systems and Applications XIII

6 March 2021 | Online Only, California, United States

Interferometry XX

24 August 2020 | Online Only, California, United States

Dimensional Optical Metrology and Inspection for Practical Applications IX

27 April 2020 | Online Only, California, United States

Emerging Digital Micromirror Device Based Systems and Applications XII

4 February 2020 | San Francisco, California, United States

Emerging Digital Micromirror Device Based Systems and Applications XI

5 February 2019 | San Francisco, California, United States

Interferometry XIX

21 August 2018 | San Diego, California, United States

Dimensional Optical Metrology and Inspection for Practical Applications VII

18 April 2018 | Orlando, FL, United States

Showing 5 of 17 Conference Committees

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