Dr. Benjamin D. Buckner
SPIE Involvement:
Author
Area of Expertise:
schlieren imaging , light scattering , digital holography , camera calibration
Publications (16)

Proceedings Article | 3 September 2019 Presentation + Paper
Proc. SPIE. 11102, Applied Optical Metrology III
KEYWORDS: Schlieren techniques, Distortion, Cameras, Calibration, Imaging systems, Projection systems, Lenses, Digital imaging, Image processing

Proceedings Article | 6 September 2017 Presentation + Paper
Proc. SPIE. 10410, Unconventional and Indirect Imaging, Image Reconstruction, and Wavefront Sensing 2017
KEYWORDS: Wavefront distortions, Wavefronts, Rayleigh scattering, Wavefront sensors, Optical sensors, Aerodynamics, Distortion

Proceedings Article | 23 August 2017 Presentation + Paper
Proc. SPIE. 10373, Applied Optical Metrology II
KEYWORDS: Visualization, Imaging systems, Aerodynamics, Thermal effects, Lenses, Calibration, Convection, Collimation, Mirrors, Cameras

Proceedings Article | 1 September 2015 Paper
Proc. SPIE. 9576, Applied Advanced Optical Metrology Solutions
KEYWORDS: Cameras, Imaging systems, Image processing, Refractive index, Visualization, Computing systems, Light sources, Light emitting diodes, Optical filters, Digital imaging

Proceedings Article | 1 September 2015 Paper
Proc. SPIE. 9576, Applied Advanced Optical Metrology Solutions
KEYWORDS: Cameras, Calibration, Projection systems, Imaging systems, LCDs, Analog electronics, Modulators, Optical filters, Distortion, Convection

Showing 5 of 16 publications
SIGN IN TO:
  • View contact details

UPDATE YOUR PROFILE
Is this your profile? Update it now.
Don’t have a profile and want one?

Advertisement
Advertisement
Back to Top