Ben Gable
Component Product Manager
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 7 February 2009
Proc. SPIE. 7229, Vertical-Cavity Surface-Emitting Lasers XIII
KEYWORDS: Wafer-level optics, Oxides, Transceivers, Reliability, Photomasks, Vertical cavity surface emitting lasers, Semiconducting wafers, Failure analysis, Standards development, Temperature metrology

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