Mr. Benjamin D Donovan
Graduate Research Assistant
SPIE Involvement:
Author
Publications (7)

PROCEEDINGS ARTICLE | August 29, 2017
Proc. SPIE. 10397, UV, X-Ray, and Gamma-Ray Space Instrumentation for Astronomy XX
KEYWORDS: Signal to noise ratio, Rockets, CMOS sensors, Spectroscopy, X-rays, Imaging spectroscopy, Collimators, Extreme ultraviolet, X-ray imaging, Spectroscopes

SPIE Journal Paper | April 25, 2016
JATIS Vol. 2 Issue 02
KEYWORDS: Diffraction gratings, Magnesium, X-rays, Diffraction, Silicon, Spectroscopy, Sensors, Point spread functions, Semiconducting wafers, Etching

SPIE Journal Paper | December 22, 2015
JATIS Vol. 1 Issue 04
KEYWORDS: Spectrographs, Diffraction gratings, Silicon, Sensors, X-rays, Charge-coupled devices, Astronomical imaging, Telescopes, Diffraction, CCD image sensors

PROCEEDINGS ARTICLE | September 23, 2015
Proc. SPIE. 9603, Optics for EUV, X-Ray, and Gamma-Ray Astronomy VII
KEYWORDS: Observatories, Telescopes, Mirrors, CMOS sensors, Segmented mirrors, Metrology, Sensors, X-rays, Optical alignment, Tolerancing

PROCEEDINGS ARTICLE | September 4, 2015
Proc. SPIE. 9603, Optics for EUV, X-Ray, and Gamma-Ray Astronomy VII
KEYWORDS: Actuators, Point spread functions, Telescopes, Spectrographs, X-ray optics, Ultraviolet radiation, X-rays, Silicon, Spectral resolution, Optical alignment

PROCEEDINGS ARTICLE | May 12, 2015
Proc. SPIE. 9510, EUV and X-ray Optics: Synergy between Laboratory and Space IV
KEYWORDS: Point spread functions, Spectrographs, X-ray optics, Sensors, Dispersion, X-rays, Silicon, Charge-coupled devices, CCD image sensors, Semiconducting wafers

Showing 5 of 7 publications
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