Mr. Benoit H. Hamon Profile

Benoit H. Hamon

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PROCEEDINGS ARTICLE | September 18, 2014

A new lifetime estimation model for a quicker LED reliability prediction

Proc. SPIE. 9190, Thirteenth International Conference on Solid State Lighting

KEYWORDS: Light emitting diodes, LED lighting, Statistical analysis, Reliability, Resistance, Humidity, Diodes, Optics manufacturing, Electrical breakdown, Temperature metrology

Read Abstract

LED reliability and lifetime prediction is a key point for Solid State Lighting adoption. For this purpose, one hundred and fifty LEDs have been aged for a reliability analysis. LEDs have been grouped following nine current-temperature stress conditions. Stress driving current was fixed between 350mA and 1A and ambient temperature between 85C and 120°C. Using integrating sphere and I(V) measurements, a cross study of the evolution of electrical and optical characteristics has been done. Results show two main failure mechanisms regarding lumen maintenance. The first one is the typically observed lumen depreciation and the second one is a much more quicker depreciation related to an increase of the leakage and non radiative currents. Models of the typical lumen depreciation and leakage resistance depreciation have been made using electrical and optical measurements during the aging tests. The combination of those models allows a new method toward a quicker LED lifetime prediction. These two models have been used for lifetime predictions for LEDs.

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