Prof. Bernard Cretin
at Univ de Franche-Comte
SPIE Involvement:
Author
Publications (10)

PROCEEDINGS ARTICLE | June 9, 2008
Proc. SPIE. 6791, Saratov Fall Meeting 2007: Optical Technologies in Biophysics and Medicine IX
KEYWORDS: Microfluidics, Biomedical optics, Optical spheres, Interferometers, Sensors, Silicon, Heterodyning, Microsensors, Liquids, Near field optics

PROCEEDINGS ARTICLE | June 13, 2005
Proc. SPIE. 5856, Optical Measurement Systems for Industrial Inspection IV
KEYWORDS: Microscopes, Photodetectors, Statistical analysis, Silica, Interferometers, Microscopy, Silicon, Atomic force microscopy, Heterodyning, Statistical modeling

PROCEEDINGS ARTICLE | June 13, 2005
Proc. SPIE. 5856, Optical Measurement Systems for Industrial Inspection IV
KEYWORDS: Microelectromechanical systems, Cameras, Image processing, Video, Microscopy, Silicon, Fourier transforms, Vibrometry, Motion measurement, Motion estimation

PROCEEDINGS ARTICLE | August 17, 2004
Proc. SPIE. 5458, Optical Micro- and Nanometrology in Manufacturing Technology
KEYWORDS: Microelectromechanical systems, Light emitting diodes, Cameras, Image processing, Video, Silicon, Image resolution, Beam shaping, Motion measurement, Motion estimation

PROCEEDINGS ARTICLE | October 3, 2003
Proc. SPIE. 5145, Microsystems Engineering: Metrology and Inspection III
KEYWORDS: Microelectromechanical systems, Signal to noise ratio, Electronics, Microsystems, Interferometers, Cameras, Image processing, Interferometry, Heterodyning, Laser beam diagnostics

PROCEEDINGS ARTICLE | October 23, 2001
Proc. SPIE. 4400, Microsystems Engineering: Metrology and Inspection
KEYWORDS: Microelectromechanical systems, Microscopes, Microresonators, Optical spheres, Interferometers, Silicon, Near field, Heterodyning, Laser beam diagnostics, Near field optics

Showing 5 of 10 publications
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