Dr. Bernd Bodermann
at Physikalisch Technische Bundesanstalt
SPIE Involvement:
Author | Editor
Publications (70)

Proceedings Article | 18 June 2024 Presentation
Tim Käseberg, Jana Grundmann, Thomas Siefke, Stefanie Kroker, Bernd Bodermann
Proceedings Volume 12997, 1299706 (2024) https://doi.org/10.1117/12.3021873

Proceedings Article | 23 August 2023 Presentation
Jan Krüger, Bernd Bodermann, Rainer Köning, Phillip Manley, Lin Zschiedrich, Philipp-Immanuel Schneider, Andreas Heinrich, Christian Eder, Ulrike Zeiser, Aksel Goehnermeier
Proceedings Volume PC12619, PC126190A (2023) https://doi.org/10.1117/12.2672294
KEYWORDS: Optical aberrations, Imaging systems, Optical microscopes, Metrology, Point spread functions, Simulations, Reflection, Quality systems, Polarization, Objectives

Proceedings Article | 23 August 2023 Presentation
Jana Grundmann, Tim Käseberg, Bernd Bodermann
Proceedings Volume PC12619, PC1261903 (2023) https://doi.org/10.1117/12.2673770
KEYWORDS: Nanowires, Mueller matrices, Silicon, Numerical simulations, Optical testing, Process control, Ellipsometry, Solar energy, Optics manufacturing, Maxwell equations

Proceedings Article | 23 August 2023 Presentation
Phillip Manley, Jan Krüger, Bernd Bodermann, Rainer Köning, Andreas Heinrich, Christian Eder, Aksel Goehnermeier, Ulrike Zeiser, Martin Hammerschmidt, Lin Zschiedrich, Philipp-Immanuel Schneider
Proceedings Volume PC12619, PC126190B (2023) https://doi.org/10.1117/12.2673077
KEYWORDS: Nanostructures, Electron microscopy, Scattering, Diffraction limit, Diffraction, Optical microscopy, Near field optics, Near field, Multilayers, Modeling

Proceedings Article | 23 August 2023 Presentation
Proceedings Volume PC12619, PC1261909 (2023) https://doi.org/10.1117/12.2673769
KEYWORDS: Plasmonics, Lenses, Design and modelling, Nano optics, Flat optics, Integrated optics, Fabrication, Surface plasmon polaritons, Spectroscopy, Numerical simulations

Showing 5 of 70 publications
Proceedings Volume Editor (9)

SPIE Conference Volume | 30 August 2023

SPIE Conference Volume | 30 June 2021

SPIE Conference Volume | 22 August 2019

SPIE Conference Volume | 27 July 2017

SPIE Conference Volume | 21 June 2015

Showing 5 of 9 publications
Conference Committee Involvement (11)
Modeling Aspects in Optical Metrology IX
26 June 2023 | Munich, Germany
Modeling Aspects in Optical Metrology VIII
21 June 2021 | Online Only, Germany
Modeling Aspects in Optical Metrology VII
24 June 2019 | Munich, Germany
Modeling Aspects in Optical Metrology
26 June 2017 | Munich, Germany
Modeling Aspects in Optical Metrology V
23 June 2015 | Munich, Germany
Showing 5 of 11 Conference Committees
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