Dr. Bernd Eppich
at Ferdinand-Braun-Institut
SPIE Involvement:
Author | Instructor
Publications (34)

PROCEEDINGS ARTICLE | February 22, 2017
Proc. SPIE. 10086, High-Power Diode Laser Technology XV
KEYWORDS: Fiber amplifiers, Laser sources, Optical amplifiers, Semiconductor optical amplifiers, Biomedical optics, Waveguides, Polarization, Polarization maintaining fibers, LIDAR, Spectroscopy, High power lasers, Laser development, Free space, Semiconductor lasers, Collimation, Distributed Bragg reflectors, Laser amplifiers, Molybdenum, Laser optics, Fiber coupled lasers

PROCEEDINGS ARTICLE | February 16, 2017
Proc. SPIE. 10100, Optical Components and Materials XIV
KEYWORDS: Optical filters, Phase modulation, Waveguides, Polarization, Laser development, Single mode fibers, Optical testing, Semiconductor lasers, Aspheric lenses, Beam shaping, Fiber couplers, Optical isolators, Indium gallium phosphide, Fiber coupled lasers

PROCEEDINGS ARTICLE | March 7, 2016
Proc. SPIE. 9770, Advances in Display Technologies VI
KEYWORDS: Diffraction, Monochromatic aberrations, Visible radiation, Light sources, Holography, Optical amplifiers, Coherence (optics), Cameras, Laser development, Interferometry, Amplifiers, Semiconductor lasers, Signal processing, Distributed Bragg reflectors, Laser based displays, Molybdenum, RGB color model

PROCEEDINGS ARTICLE | March 4, 2016
Proc. SPIE. 9731, Nonlinear Frequency Generation and Conversion: Materials, Devices, and Applications XV
KEYWORDS: Confocal microscopy, Near infrared, Reflectors, Laser sources, Optical amplifiers, Oscillators, Crystals, Laser applications, Amplifiers, Semiconductor lasers, Laser crystals, Harmonic generation, Light

PROCEEDINGS ARTICLE | March 4, 2016
Proc. SPIE. 9731, Nonlinear Frequency Generation and Conversion: Materials, Devices, and Applications XV
KEYWORDS: Light sources, Second-harmonic generation, Deep ultraviolet, Ultraviolet radiation, High power lasers, Crystals, Semiconductor lasers, Raman spectroscopy, Gallium nitride, Harmonic generation, Frequency conversion, Laser systems engineering

PROCEEDINGS ARTICLE | March 20, 2015
Proc. SPIE. 9382, Novel In-Plane Semiconductor Lasers XIV
KEYWORDS: Light sources, Fabry–Perot interferometers, Deep ultraviolet, High power lasers, Complex systems, Semiconductor lasers, Gallium nitride, Diodes, Laser systems engineering, Diffraction gratings

Showing 5 of 34 publications
Course Instructor
SC731: Laser Beam Characterization
This course gives an introduction on theoretical and practical aspects of laser beam characterization based on the concept of second order moments. This concept is the fundament of the current ISO 11146 standard and is important for both laser development and laser application. The first, more theoretical part of the course presents the definition of the second order moments as a measure for a beams transverse extent. Advantages and disadvantages against other beam width definitions are discussed considering some typical beam profiles. The propagation law of the second order moments through aberration-free first order optical systems is presented as well as the relationship to other beam propagation parameters like divergence, Rayleigh length, wavefront, astigmatism, etc. A geometric and intrinsic beam classification derived from the propagation properties through stigmatic and simple-astigmatic optical systems will be introduced. The second part of the course deals with all aspects of experimental beam characterization. Different measurement schemes are presented and discussed in detail. Emphasis is given to CCD camera based measurements, including discussion of typical image distortions and their compensation, determination of suitable regions of interest, and determination of the offset level. The final part of the course gives a short outlook on beam characterization beyond the current standards, demonstrating how a complete characterization of partially coherent beams can be achieved by interferometric and non-interferometric measurement setups.
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