Many applications in the field of X-ray analytics require an X-ray beam with a high flux density at the sample position. Examples for these applications are single crystal diffraction or micro-diffraction to name but a few. An X-ray system comprising of an X-ray source with a small electron beam spot size combined with a diffracting 2-dimensional multilayer mirror is the ideal source for these applications. The mirror collects many photons from the small source, especially when it is mounted as close to the source as possible.
To achieve the goal of a high flux density the spot size on the anode of the X-ray tube should be as small as possible with a simultaneous increase of the X-ray power. A risk is the melting of the anode due to weak heat dissipation. At the same time the figure error of the multilayer mirror should be as low as possible. Large figure errors will increase the spot size of the X-ray beam at the sample position.
The increasing importance of X-ray diffractometry with one- and two-dimensional detectors for materials research has
lead to a rising demand for highly intense X-ray sources enabling the analysis of very small and weakly scattering
samples in the home-lab within a reasonable time frame. As a result, various microfocusing sealed tube X-ray sources
with focal spot sizes below 50μm are now available. Potential applications of the low-maintenance, high-brilliance
microfocus source IμS, which are equipped with different two-dimensional beam shaping multilayer optics, will be
shown. With the instrumentation that is now available, more and more crucial measurements like gracing incidence
small angle X-ray scattering or stress and pole figure measurements can be carried out in the lab, and even in-situ during
dynamic processes. Some ideas on new instrumental set-ups for customized X-ray analytics will also be shown.