Mr. Bernd C. Meyer
Specialist Scientific Instrumentation
SPIE Involvement:
Conference Program Committee | Author
Publications (3)

PROCEEDINGS ARTICLE | September 7, 2017
Proc. SPIE. 10385, Advances in Metrology for X-Ray and EUV Optics VII
KEYWORDS: X-ray optics, Metrology, Nano opto mechanical systems, Signal attenuation, Calibration, Interferometry, Optical fabrication, Optical metrology, Temperature metrology

PROCEEDINGS ARTICLE | August 23, 2017
Proc. SPIE. 10388, Advances in Computational Methods for X-Ray Optics IV
KEYWORDS: Optical components, Spectroscopy, X-rays, Wavefronts, Wave propagation, Thermal effects, Optical simulations, Beam propagation method, Device simulation

PROCEEDINGS ARTICLE | September 23, 2011
Proc. SPIE. 8141, Advances in Computational Methods for X-Ray Optics II
KEYWORDS: Optical components, Optical filters, Mirrors, X-ray optics, Error analysis, Crystals, Finite element methods, Optical simulations, Synchrotrons, Monochromators

Conference Committee Involvement (3)
Advances in Computational Methods for X-Ray Optics IV
9 August 2017 | San Diego, California, United States
Advances in Computational Methods for X-Ray Optics III
19 August 2014 | San Diego, California, United States
Advances in Computational Methods for X-Ray Optics II
21 August 2011 | San Diego, California, United States
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