Mr. Bernd C. Meyer
Specialist Scientific Instrumentation
SPIE Involvement:
Conference Program Committee | Author
Publications (3)

PROCEEDINGS ARTICLE | September 7, 2017
Proc. SPIE. 10385, Advances in Metrology for X-Ray and EUV Optics VII
KEYWORDS: Metrology, Optical metrology, Interferometry, Nano opto mechanical systems, X-ray optics, Calibration, Optical fabrication, Signal attenuation, Temperature metrology

PROCEEDINGS ARTICLE | August 23, 2017
Proc. SPIE. 10388, Advances in Computational Methods for X-Ray Optics IV
KEYWORDS: Optical simulations, X-rays, Wavefronts, Wave propagation, Optical components, Thermal effects, Beam propagation method, Device simulation, Spectroscopy

PROCEEDINGS ARTICLE | September 23, 2011
Proc. SPIE. 8141, Advances in Computational Methods for X-Ray Optics II
KEYWORDS: Mirrors, Optical components, Optical simulations, Synchrotrons, X-ray optics, Monochromators, Finite element methods, Crystals, Error analysis, Optical filters

Conference Committee Involvement (3)
Advances in Computational Methods for X-Ray Optics IV
9 August 2017 | San Diego, California, United States
Advances in Computational Methods for X-Ray Optics III
19 August 2014 | San Diego, California, United States
Advances in Computational Methods for X-Ray Optics II
21 August 2011 | San Diego, California, United States
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