Dr. Bernd Randolf Müller
at Bundesanstalt für Materialforschung und -prüfung
SPIE Involvement:
Author
Publications (2)

Proceedings Article | 16 September 2008
Proc. SPIE. 7078, Developments in X-Ray Tomography VI
KEYWORDS: Light sources, Cameras, Sensors, Crystals, X-rays, Scintillators, Image resolution, Synchrotrons, Spatial resolution, Monochromators

Proceedings Article | 9 May 2005
Proc. SPIE. 5766, Testing, Reliability, and Application of Micro- and Nano-Material Systems III
KEYWORDS: Scattering, Crystals, X-rays, Ceramics, Composites, Interfaces, Nondestructive evaluation, Refraction, Computed tomography, Absorption

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