Dr. Bernhard von Blanckenhagen
at Carl Zeiss Vision GmbH
SPIE Involvement:
Author
Publications (4)

SPIE Journal Paper | June 1, 2008
OE Vol. 47 Issue 06
KEYWORDS: Multilayers, Reflectivity, Surface roughness, Silicon, Atomic force microscopy, Optical coatings, Extreme ultraviolet, EUV optics, X-rays, Scattering

PROCEEDINGS ARTICLE | October 5, 2005
Proc. SPIE. 5963, Advances in Optical Thin Films II
KEYWORDS: Oxides, Deep ultraviolet, Metals, Crystals, Ions, Monte Carlo methods, Solids, Aluminum, Plasma, Absorption

PROCEEDINGS ARTICLE | October 5, 2005
Proc. SPIE. 5963, Advances in Optical Thin Films II
KEYWORDS: Multilayers, Data modeling, Reflection, Dielectrics, Interfaces, Ions, Silver, Coating, Reflectivity, Absorption

PROCEEDINGS ARTICLE | February 25, 2004
Proc. SPIE. 5250, Advances in Optical Thin Films
KEYWORDS: Ellipsometry, Refractive index, Multilayers, Data modeling, X-rays, Dielectrics, Optical coatings, Reflectometry, Grazing incidence, Thin film coatings

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