Dr. Bertrand M. Reulet
at Univ de Sherbrooke
SPIE Involvement:
Author
Publications (3)

PROCEEDINGS ARTICLE | June 8, 2007
Proc. SPIE. 6600, Noise and Fluctuations in Circuits, Devices, and Materials
KEYWORDS: Modulation, Scattering, Digital filtering, Diffusion, Time metrology, Solids, Image filtering, Optical correlators, Lawrencium, Temperature metrology

PROCEEDINGS ARTICLE | May 25, 2004
Proc. SPIE. 5469, Fluctuations and Noise in Materials
KEYWORDS: Signal to noise ratio, Transparency, Opacity, Calibration, Resistance, Amplifiers, Resistors, Optical correlators, Electromagnetism, Environmental sensing

PROCEEDINGS ARTICLE | May 8, 2003
Proc. SPIE. 5115, Noise and Information in Nanoelectronics, Sensors, and Standards
KEYWORDS: Sensors, Chemical species, Electrodes, Electrons, Nanoelectronics, Superconductivity, Carbon nanotubes

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