Bi Kun
at Harbin Engineering Univ
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 27 November 2007
Proc. SPIE. 6723, 3rd International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment
KEYWORDS: Signal to noise ratio, Spectrum analysis, Digital signal processing, Statistical analysis, Doppler effect, Error analysis, Fourier transforms, Computer simulations, Signal processing, Laser Doppler velocimetry

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