Bill Hansen
at Sigray Inc
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 22 October 2019
Proc. SPIE. 11110, Advances in Laboratory-based X-Ray Sources, Optics, and Applications VII
KEYWORDS: X-ray optics, Diamond, Patents, Detection and tracking algorithms, Sensors, Metals, X-rays, X-ray sources, X-ray microscopy, X-ray imaging

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