Dr. Bin Xu Profile

Dr. Bin Xu

at Tohoku Univ

SPIE Involvement:

Author

Publications (2)

PROCEEDINGS ARTICLE | June 22, 2013

Surface form metrology of micro-optics

Proc. SPIE. 8769, International Conference on Optics in Precision Engineering and Nanotechnology (icOPEN2013)

KEYWORDS: Microscopes, Diffraction, Metrology, Lenses, Computer programming, Atomic force microscopy, Profiling, Micro optics, Optical scanning systems, Diffraction gratings

Read Abstract

PROCEEDINGS ARTICLE | November 16, 2011

A glass tube micro-stylus probe for surface form metrology

Proc. SPIE. 8321, Seventh International Symposium on Precision Engineering Measurements and Instrumentation

KEYWORDS: Actuators, Optical components, Ferroelectric materials, Metrology, Sensors, Glasses, Atomic force microscopy, Neodymium, Tolerancing, Scanning tunneling microscopy

Read Abstract

View contact details

UPDATE YOUR PROFILE

Is this your profile? Update it now.

Sign into your SPIE.org account

Don’t have a profile and want one?

Create an account on SPIE.org

Keywords/Phrases

Search In:

Publication Years