Dr. Bing Ye
at Hefei Univ of Technology
SPIE Involvement:
Author
Publications (1)

PROCEEDINGS ARTICLE | January 24, 2008
Proc. SPIE. 6829, Advanced Materials and Devices for Sensing and Imaging III
KEYWORDS: 3D acquisition, 3D image reconstruction, Image processing, 3D modeling, Feature extraction, Optical testing, Optical scanning, 3D metrology, CCD image sensors, 3D image processing

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