The temperature-dependent refractive index of zinc telluride film can be used to develop a tiny, low cost and film-coated optical fiber temperature sensor. Pulse reference-based compensation technique is used to largely reduce the background noise which makes it possible to detect the minor reflectivity change of the film in different temperatures. The temperature sensitivity is 0.0034dB/℃ and the background noise is measured to be 0.0005dB, so the resolution can achieve 0.2℃.
The authors report the study of thermal annealing (TA) effects on the intersubband transitions (ISB-T) properties in (CdS/ZnSe)/BeTe and CdS/ZnSe multiple quantum wells (MQWs). The samples were grown on (001)-GaAs substrates by molecular beam epitaxy. With the increase of annealing temperature, the ISB-T shifts to longer wavelength in (CdS/ZnSe)/BeTe MQWs, but to short wavelength in CdS/ZnSe MQWs. The ISB absorption vanishes at the annealing temperature of 270 °C for CdS/ZnSe QWs while survives to up to 440 °C for (CdS/ZnSe)/BeTe QWs. For (CdS/ZnSe)/BeTe MQWs after 20 minutes of TA, absorption wavelength and intensity become stable. For CdS/ZnSe MQWs, however we observed a blue shift in wavelength accompanied by a decrease of intensity after 45 minutes of TA. Photo-induced ISB-T measurements indicate that the disappearance of ISB absorption results from the loss of free-carriers in the well layers. ω/2θ scan and two-dimensional reciprocal space mapping (2DRSM)) measurements of X-ray diffraction (XRD) indicate that a built-up of tensile strain and interdiffusion at interfacial region in the annealed (CdS/ZnSe)/BeTe heterostructrues. 2DRSM also shows the enhanced structural relaxation in CdS/ZnSe MQWs. Based on the XRD analysis, the effects of TA on the ISB-T in (CdS/ZnSe)/BeTe and CdS/ZnSe MQWs are explained.