Bingzhi Yuan
Doctoral Candidate at Hiroshima Univ
SPIE Involvement:
Author
Publications (2)

SPIE Journal Paper | 19 July 2017
JMI Vol. 4 Issue 03
KEYWORDS: Optical tomography, Inverse problems, Error analysis

SPIE Journal Paper | 13 August 2015
JMI Vol. 2 Issue 03
KEYWORDS: Scattering, Optical tomography, Light sources, Sensors, Light scattering, Light, Mass attenuation coefficient, Numerical simulations, Monte Carlo methods, Inverse problems

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