Dr. Bisser Raytchev
at Hiroshima Univ
SPIE Involvement:
Area of Expertise:
machine learning , computer vision , medical image analysis , image processing , data analysis
Profile Summary

Research/Teaching Experience:

Hiroshima University, Department of Information Engineering,
Intelligent Systems & Modelling Laboratory (Hiroshima, Japan)
Assistant Professor

National Institute of Advanced Industrial Science and Technology (AIST),
Information Technology Research Institute, Ubiquitous Vision Group (Tsukuba, Japan)
Research Fellow & Technical Staff

2000-2003 NTT Communication Science Laboratories,
Nippon Telephone & Telegraph Corporation (NTT)
Recognition Research Group, Media Information Laboratory (Atsugi, Japan)
Research Associate

Research Interests Keywords:

pattern recognition and machine learning; statistical learning theory; non-linear manifold learning; statistical dimensionality reduction; neural networks; computer vision; multiple-view geometry; shape representation, modeling and estimation; motion estimation and tracking; image processing and analysis; signal processing; automatic face and gesture recognition; human-computer interaction; video surveillance and monitoring; data mining and statistical data analysis; medical image analysis; bio-image analysis; scientific visualization;

Other Professional Services:

- Program Committee: International Conference on Pattern Recognition (ICPR2014, ICPR2012, ICPR2010), Bio-Image Recognition BIR2013, Subspace 2010 in conjunction with Asian Conference Computer Vision 2010 (ACCV2010), Subspace 2009 in conjunction with Int. Conf. Computer Vision (ICCV2009), Int. Workshop on Advances in Networking and Computing WANC2011, WANC2010, etc.
- Member of IEEE, IEEE Computer Society, IEEE Signal Processing Society, ACM, MICCAI
- Reviewer (referee) for international journals like IEEE Transactions on Image Processing, International Journal of Computer Vision (IJCV), Computer Vision and Image Understanding (CVIU), IEEE Transactions on Neural Networks, IEEE Transactions on Systems, Man And Cybernetics (T-SMC), Machine Vision & Applications (MVA), etc.
Publications (3)

SPIE Journal Paper | July 19, 2017
JMI Vol. 4 Issue 03
KEYWORDS: Optical tomography, Inverse problems, Error analysis

SPIE Journal Paper | August 13, 2015
JMI Vol. 2 Issue 03
KEYWORDS: Scattering, Optical tomography, Light sources, Sensors, Light scattering, Light, Mass attenuation coefficient, Numerical simulations, Monte Carlo methods, Inverse problems

Proc. SPIE. 9413, Medical Imaging 2015: Image Processing
KEYWORDS: Endoscopy, Image compression, Visualization, Medical research, Computer programming, Medical imaging, Image quality, Quantization, Image classification, Expectation maximization algorithms

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