Biyu Zhao
at Univ of Electronic Science and Technology of China
SPIE Involvement:
Author
Publications (5)

SPIE Journal Paper | June 29, 2016
OE Vol. 55 Issue 06
KEYWORDS: Calibration, Cameras, Imaging systems, Projection systems, Distortion, Optical engineering, Fringe analysis, Zirconium, Lithium, Mathematical modeling

SPIE Journal Paper | April 7, 2015
OE Vol. 54 Issue 04
KEYWORDS: Signal to noise ratio, Backscatter, Fourier transforms, Spatial resolution, Sensing systems, Reflectometry, Signal processing, Ferroelectric materials, Data acquisition, Interference (communication)

PROCEEDINGS ARTICLE | September 18, 2014
Proc. SPIE. 9282, 7th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment
KEYWORDS: Fringe analysis, Wavelet transforms, Image processing, Denoising, Fourier transforms, Image analysis, 3D metrology, Projection systems, Image denoising, 3D image processing

PROCEEDINGS ARTICLE | September 18, 2014
Proc. SPIE. 9282, 7th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment
KEYWORDS: Photovoltaics, Fringe analysis, Defect detection, Inspection, Phase shift keying, Deflectometry, Wafer inspection, Spatial resolution, Semiconducting wafers, Defect inspection

PROCEEDINGS ARTICLE | June 22, 2013
Proc. SPIE. 8769, International Conference on Optics in Precision Engineering and Nanotechnology (icOPEN2013)
KEYWORDS: Mirrors, Fringe analysis, Error analysis, Complex systems, Phase shift keying, Computer simulations, CCD cameras, Deflectometry, LCDs, Zernike polynomials

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